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Case File

CVE-2019-20607

CRITICAL · CVSS 9.8 EPSS 0.88% Public Exploit

Source: NVD + CISA KEV + EPSS (historical backfill) · Published 2020-03-24 · Last synced 2026-08-04

CyberRota Analysis

This is a critical severity vulnerability with a CVSS score of 9.8. Public exploit code or proof-of-concept references have been detected in its references.

Public Exploit Signal

A public exploit, PoC, GitHub repository or Metasploit reference was detected for this CVE.

Detected Signals
arbitrary code execution code execution

Note: these links are listed for security research and verification purposes only.

CVE
CVE-2019-20607
Severity
CRITICAL
CVSS
9.8
EPSS
0.88%

Original NVD Description

An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).

Related CVEs

Other vulnerabilities affecting the same vendor(s)